Padmi
Cyient

Design-for-Test (DFT)

BangalorePosted 1 month ago
Electrical Electronics And Computer Hardware EngineeringSenior
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Scan Shift. Full Scan. Scan Compression. Scan Chain Stitching. Test Point Insertion. Boundary Scan (JTAG). MBIST Integration. LBIST (Preferred)

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Design-for-Test (DFT) at Cyient · Padmi