Test Solutions Engineer At Micron Technology In Hyderabad (India)

APPLY HERE Location: Hyderabad Company: Micron Technology NAND Probe/ Back End Testing Improve Probe testing coverage, quality and on NAND products Own the probe test flow, review and sign off probe test program release to ensure quality control Utilise state-of-the-art in-house engineering equipment to support product characterisation and electrical failure analysis Develop creative testing algorithms to improve testing efficiency New Generation Product Development Responsible for new product startup and yield improvement Support design verification and in-depth circuit of new products using CAD tools and Verilog simulations Work with the wafer fab process/integration group to address process-related defects affecting product yield Identify design marginalities and recommend design fix for circuit-related problems Functional and Design Validation Design novel test algorithms and develop test programs for validating NAND features and commands Use high-speed tester hardware to perform validation of recent NAND devices Analysis of failures generated from the evaluations Automation of program development and work processes using scripting Product Yield Enhancement Identify causes of low yield through systematic analysis Work closely with various engineering groups in resolving process/defects related issues Perform electrical/physical failure analysis to understand the failure mechanism relating to defects / fab process Utilize statistical tools for detailed data analysis on product to drive yield improvement projects Managed NAND (MNAND) Products Develop high quality and cost-efficient MNAND test strategies Understand 3D NAND defect mechanisms and MNAND system error recovery features Collaborate with test engineering teams to define and secure necessary test fixtures for memory and system testing Conduct electrical failure analysis of the MNAND products through different phases of the product life cycling such as qualification, high volume manufacturing and c APPLY HERE Location: Hyderabad Company: Micron Technology NAND Probe/ Back End Testing Improve Probe testing coverage, quality and on NAND products Own the probe test flow, review and sign off probe test program release to ensure quality control Utilise state-of-the-art in-house engineering equipment to support product characterisation and electrical failure analysis Develop creative testing algorithms to improve testing efficiency New Generation Product Development Responsible for new product startup and yield improvement Support design verification and in-depth circuit of new products using CAD tools and Verilog simulations Work with the wafer fab process/integration group to address process-related defects affecting product yield Identify design marginalities and recommend design fix for circuit-related problems Functional and Design Validation Design novel test algorithms and develop test programs for validating NAND features and commands Use high-speed tester hardware to perform validation of recent NAND devices Analysis of failures generated from the evaluations Automation of program development and work processes using scripting Product Yield Enhancement Identify causes of low yield through systematic analysis Work closely with various engineering groups in resolving process/defects related issues Perform electrical/physical failure analysis to understand the failure mechanism relating to defects / fab process Utilize statistical tools for detailed data analysis on product to drive yield improvement projects Managed NAND (MNAND) Products Develop high quality and cost-efficient MNAND test strategies Understand 3D NAND defect mechanisms and MNAND system error recovery features Collaborate with test engineering teams to define and secure necessary test fixtures for memory and system testing Conduct electrical failure analysis of the MNAND products through different phases of the product life cycling such as qualification, high volume manufacturing and c